POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
By: Nicolici,Nicola.
Contributor(s): Al-Hashimi,Bashir M.
Material type:
BookPublisher: Kluwer Academic Publishers, Boston 2003Description: x,178.ISBN: 140207235X.Subject(s): Integrated Circuits, Very Large Scale Integration -- Testing | Semiconductors -- Thermal PropertiesDDC classification: 621.3950287 | N545P
| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3950287 N545P (Browse shelf) | Book Request | s | Available | A148129 |
Total holds: 0
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