THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS
By: Richards,B. P.,Footner,P. K.
Material type:
BookPublisher: Oxford Univ. Pr.,Oxford 1992Description: vi 108.ISBN: 0 19 856432 5.Subject(s): Semiconductors -- Testing | Microscope And MicroscopyDDC classification: 621.38152 | R39
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 R39 (Browse shelf) | Book Request | Available | A116025 |
Total holds: 0
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| 621.38152 R247P PHOTOINDUCED DEFECTS IN SEMICONDUCTORS | 621.38152 R252S SILICON PHOTONICS | 621.38152 R279 RALIABILITY AND DEGRADATION | 621.38152 R39 THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS | 621.38152 R52 RADIATION DAMAGE AND DEFECTS IN SEMICONDUCTORS | 621.38152 Sa87w WORKING WITH SEMICONDUCTORS | 621.38152 SC27 SCIENCE AND TECHNOLOGY OF ELECTROCERAMIC THIN FILMS |
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