PKK Library

Your cart is empty.

Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

Your search returned 5 results. Subscribe to this search

Unhighlight Highlight
|
1.
MICROHARDNESS OF METALS AND SEMICONDUCTORS

by Glazov, V. M | Vigdorovich, V. N.

Material type: book Book; Format: print ; Literary form: not fiction Description: 226.Publisher: N. Y. Consultants Bureau 1971Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.1126 G469mE] (1).

Place hold Add to cart
2.
SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION

by Schroder, Dieter K.

Material type: book Book Description: xv,599.Publisher: New York John Wiley c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 Sch75s] (1).

Place hold Add to cart
3.
THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS

by Richards,B. P.,Footner,P. K.

Material type: book Book; Format: print ; Literary form: not fiction Description: vi 108.Publisher: Oxford Univ. Pr.,Oxford 1992Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 R39] (1).

Place hold Add to cart
4.
NONDESTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES

by Zemel, Jay N | .

Description: xi,782.Publisher: New York Plenum 1979Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 N811n] (1).

Place hold Add to cart
5.
Semiconductor material and device characterization

by Schroder, Dieter K.

Edition: 3rd Description: xv, 779p.Publisher: New Jersey John Wiley 2006Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381 Sch75s3 cop.1] (2).

Place hold Add to cart

Powered by Koha