HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS
By: Leblebici,Yusuf.
Contributor(s): Kang,Sung-Mo (Steve).
Material type:
BookPublisher: Kluwer Academic Publishers, Boston c1993Description: xvi,212.ISBN: 079239352X.Subject(s): Integrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models | Metal Oxide Semiconductors -- Reliability -- Mathematical Models | Hot-Carriers -- Reliability -- Mathematical ModelsDDC classification: 621.395 | L492H
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.395 L492H (Browse shelf) | Available | A132867 |
Total holds: 0
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| 621.395 K45t Transient-induced latchup in CMOS integrated circuits | 621.395 K559a Advanced FPGA design | 621.395 K962v VLSI ARRAY PROCESSORS | 621.395 L492H HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS | 621.395 L57V VLSI FOR WIRELESS COMMUNICATION | 621.395 L57v2 VLSI for wireless communication | 621.395 L628p Practical problems in VLSI physical design automation |
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