METAL IMPURITIES IN SILICON-DEVICE FABRICATION
By: Graff,Klaus.
Material type:
BookPublisher: Springer-Verlag, Berlin 2000Edition: 2nd rev.Description: xv,268.ISBN: 3540642137.Subject(s): Semiconductors -- Defects | Silicon -- Defects | Silicon -- InclusionsDDC classification: 621.38152 | G758M2
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 G758M2 (Browse shelf) | Book Request | Available | A131369 |
Total holds: 0
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| 621.38152 G449o ORIENTED CRYSTALLIZATION ON AMORPHOUS SUBSTRACTS | 621.38152 G519 GLOW DISCHARGE OF HYDROGENATED AMORPHOUS SILICON | 621.38152 G643t TESTING SEMICONDUCTOR MEMORIES | 621.38152 G758M2 METAL IMPURITIES IN SILICON-DEVICE FABRICATION | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES | 621.38152 G919p PHYSICS AND TECHNOLOGY OF SEMICONDUCTOR DEVICES |
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