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Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

621.381 / K964R
Kuo,Way, Chien,Wei-Ting Kary
       RELIABILITY, YIELD, AND STRESS BURN-IN / UNIFIED APPROACH FOR MICROELECTRONICS SYSTEMS MANUFACTURING & SOFTWARE DEVELOPMENT .- Kluwer Academic Publishers,Boston, 1998 .- xxvi,394 .
ISBN: 0792381076
Subject Headings:
Integrated Circuits--Design And Construction;
Microelectronics--Reliability;
Computer Software--Development;
Author Added Entry:
Kim,Taeho;
Copy Details:
Acc. No.: A126385, Full Call No.: 621.381 K964R, Item type: Books , Location: COMPACT STORAGE (BASEMENT),
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