RANDOM TESTING OF DIGITAL CIRCUITS
By: David,Rene.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
![]() |
PK Kelkar Library, IIT Kanpur | General Stacks | 621.3815 D281R (Browse shelf) | Available | A125903 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
621.3815 C977e ELECTRONIC CIRCUIT ANALYSIS | 621.3815 C977e ELECTRONIC CIRCUIT ANALYSIS | 621.3815 D26c Carbon nanotube and graphene nanoribbon interconnects | 621.3815 D281R RANDOM TESTING OF DIGITAL CIRCUITS | 621.3815 D362g GENERAL ELECTRONICS CIRCUITS | 621.3815 D46 DESIGN OF HIGH - PERFORMANCE MICROPROCESSOR CIRCUITS | 621.3815 D628 DIRECT-WRITE TECHNOLOGIES FOR RAPID PROTOTYPING APPLICATIONS |
Includes Bibliographical References And Index
There are no comments for this item.