DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN
By: Abramovici, Miron.
Contributor(s): Friedman, Arthur D.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3815 Ab82d (Browse shelf) | Book Request | Available | A114242 |
Total holds: 0
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621.38137 B841p Principles of microwave measurements | 621.38137 Un3 IEEE STANDARD AND AMERICAN NATIONAL STANDARD GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS | 621.38141 T859i INTRODUCTION TO ELECTRICITY & RADIO | 621.3815 Ab82d DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN | 621.3815 Ad95 ADVANCES IN ELECTRONIC CIRCUIT PACKAGING | 621.3815 Ad95 ADVANCES IN ELECTRONIC CIRCUIT PACKAGING | 621.3815 Ad95 ADVANCES IN ELECTRONIC CIRCUIT PACKAGING |
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