SPECKLE METROLOGY
By: Rajpal S. Sirohi.
Contributor(s): Sirohi,Rajpal S.
Material type: BookSeries: Optical Engineering 38. Publisher: Marcel Dekker, New York c1993Description: xii,551.ISBN: 0824789326.Subject(s): Non-Destructive Testing | Speckle MetrologyDDC classification: 620.1127 | SP37Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 620.1127 SP37 (Browse shelf) | Available | A118231 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
620.1127 R325 Review of progress in quantitative nondestructive evaluation [2v.31A & 31B] | 620.1127 R325 Review of progress in quantitative nondestructive evaluation [2v.31A & 31B] | 620.1127 Sco84b BASIC ACOUSTIC EMISSION | 620.1127 SP37 SPECKLE METROLOGY | 620.11272 AD95 ADVANCES IN MATERIALS CHARACTERIZATION | 620.11272 Ad95b Advanced tomographic methods in materials research and engineering | 620.11272 R117lg RADIOGRAPHY AND RADIATION TESTING |
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