SPECKLE METROLOGY
By: Rajpal S. Sirohi.
Contributor(s): Sirohi,Rajpal S.
Material type:
BookSeries: Optical Engineering 38. Publisher: Marcel Dekker, New York c1993Description: xii,551.ISBN: 0824789326.Subject(s): Non-Destructive Testing | Speckle MetrologyDDC classification: 620.1127 | SP37
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 620.1127 SP37 (Browse shelf) | Available | A118231 |
Total holds: 0
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