RALIABILITY AND DEGRADATION
By: Howes, M. J.
Contributor(s): Morgan, D. V.
Material type:
BookSeries: Wiley Series In Solid State Devices And Circuits. Publisher: Chichester John Wiley 1981Description: xii,444.Subject(s): SemiconductorsDDC classification: 621.38152 | R279
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 R279 (Browse shelf) | Book Request | Available | A85139 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.38152 R22 Reactive sputter deposition | 621.38152 R247P PHOTOINDUCED DEFECTS IN SEMICONDUCTORS | 621.38152 R252S SILICON PHOTONICS | 621.38152 R279 RALIABILITY AND DEGRADATION | 621.38152 R39 THE ROLE OF MICROSCOPY IN SEMICONDUCTOR FAILURE ANALYSIS | 621.38152 R52 RADIATION DAMAGE AND DEFECTS IN SEMICONDUCTORS | 621.38152 Sa87w WORKING WITH SEMICONDUCTORS |
There are no comments for this item.