RALIABILITY AND DEGRADATION
By: Howes, M. J.
Contributor(s): Morgan, D. V.
Material type:
BookSeries: Wiley Series In Solid State Devices And Circuits. Publisher: Chichester John Wiley 1981Description: xii,444.Subject(s): SemiconductorsDDC classification: 621.38152 | R279
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 R279 (Browse shelf) | Book Request | Available | A85139 |
Total holds: 0
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