Fundamentals of surface and thin film analysis
By: Feldman, Leonard C.
Contributor(s): Mayer, James W [ed.].
Material type: BookPublisher: New York North-Holland 1986Description: xviii,352p.ISBN: 0444009892.Subject(s): Surfaces (Technology) -- AnalysisDDC classification: 530.41 | F333FItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 530.41 F333F (Browse shelf) | Available | A95274 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
530.41 F212E ELEMENTS OF SOLID STATE PHYSICS | 530.41 F212e ELEMENTS OF SOLID STATE PHYSICS | 530.41 F212e ELEMENTS OF SOLID STATE PHYSICS | 530.41 F333F Fundamentals of surface and thin film analysis | 530.41 F379p PHYSICAL FOUNDATIONS OF SOLID STATE AND ELECTRON DEVICES | 530.41 F523S SPIN GLASSES | 530.41 F633 THE ELECTRON BAND THEORY OF SOLIDS |
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