MICROHARDNESS OF METALS AND SEMICONDUCTORS
By: Glazov, V. M.
Contributor(s): Vigdorovich, V. N.
Material type:
BookPublisher: N. Y. Consultants Bureau 1971Description: 226.Subject(s): Hardness | Metals -- Testing | Semiconductors -- TestingDDC classification: 620.1126 | G469mE
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.1126 G469mE (Browse shelf) | Book Request | Available | A27250 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 620.1126 F841R FRACTURE RESISTANCE TESTING OF MONOLITHIS AND COMPOSITE BRITTLE MATERIALS | 620.1126 F871 FAILURE ANALYSIS OF BRITTLE MATERIALS | 620.1126 G42c Chemistry and physics of mechanical hardness | 620.1126 G469mE MICROHARDNESS OF METALS AND SEMICONDUCTORS | 620.1126 G755F FRAGMENTATION OF RINGS AND SHELLS | 620.1126 H191 HANDBOOK OF FATIGUE CRACK | 620.1126 H191E HANDBOOK OF CASE HISTORIES IN FAILURE ANALYSIS |
Ref. : P. 216-226
There are no comments for this item.