621.395
Lala, Parag K., 1948-
An introduction to logic circuit testing [electronic resource] / / Parag K. Lala. .- San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) :: Morgan & Claypool Publishers,, c2009. .- 1 electronic text (x, 99 p. : ill.) :. digital file. ** Synthesis lectures on digital circuits and systems, * # 17 1932-3174 ; )
TK7868.L6 / L255 2009 - Synthesis lectures on digital circuits and systems ; # 17. .
Part of: Synthesis digital library of engineering and computer science. Series from website.
Includes bibliographical references.
Abstract freely available; full-text restricted to subscribers or individual document purchasers.
Compendex INSPEC Google scholar Google book search
Mode of access: World Wide Web.
System requirements: Adobe Acrobat reader.
ISBN: 9781598293517 (electronic bk.) 9781598293500 (pbk.)
10.2200/S00149ED1V01Y200808DCS017 doi
Subject Headings:
Logic circuits;--Testing.
Digital electronics;--Testing.
Integrated circuits;--Very large scale integration--Testing.
Copy Details:
Acc. No.: EBKE143, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Lala, Parag K., 1948-
An introduction to logic circuit testing [electronic resource] / / Parag K. Lala. .- San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) :: Morgan & Claypool Publishers,, c2009. .- 1 electronic text (x, 99 p. : ill.) :. digital file. ** Synthesis lectures on digital circuits and systems, * # 17 1932-3174 ; )
TK7868.L6 / L255 2009 - Synthesis lectures on digital circuits and systems ; # 17. .
Part of: Synthesis digital library of engineering and computer science. Series from website.
Includes bibliographical references.
Abstract freely available; full-text restricted to subscribers or individual document purchasers.
Compendex INSPEC Google scholar Google book search
Mode of access: World Wide Web.
System requirements: Adobe Acrobat reader.
ISBN: 9781598293517 (electronic bk.) 9781598293500 (pbk.)
10.2200/S00149ED1V01Y200808DCS017 doi
Subject Headings:
Logic circuits;--Testing.
Digital electronics;--Testing.
Integrated circuits;--Very large scale integration--Testing.
Copy Details:
Acc. No.: EBKE143, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------