| 000 | 00682nam a22002057a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230111151131.0 | ||
| 008 | 230111b xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 100 | _aLassiter, William S. | ||
| 245 |
_aIn situ mass analysis of particles by surface ionization mass spectrometry [NASA TM X-3112] _cWilliam S. Lassiter |
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| 260 |
_aWashington, D. C. _bNational Aeronautics and Space Administration _c1974 |
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| 300 | _a15p | ||
| 440 | _aNational Aeronautics and Space Administration | ||
| 440 | _aNASA Technical Note | ||
| 500 | _aBound vol. contains NASA TN X 3111-3119 | ||
| 650 | _aMass spectroscopy | ||
| 942 | _cTR | ||
| 999 |
_c566403 _d566403 |
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