000			01834 a2200217 4500
003			OSt
020			_a9781606509180
040			_cIIT Kanpur
041			_aeng
082			_a502.825 _bL973p
100			_aLuo, Zhiping
245			_aA practical guide to transmission electron microscopy [Vol.2] [Perpetual access] _badvanced microscopy _cZhiping Luo
260			_bMomentum Press _c2016 _aNew York
300			_axx, 158p
440			_aMaterials characterization and analysis collection
490			_a/ edited by Richard Brundle
520			_aTransmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
650			_aTransmission electron microscopy
856			_uhttps://ebookcentral.proquest.com/lib/iitk-ebooks/reader.action?docID=4307186&query=4307186
942			_cEBK
999			_c565629 _d565629