000 | 01442 a2200229 4500 | ||
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003 | OSt | ||
020 | _a9781493966073 | ||
040 | _cIIT Kanpur | ||
041 | _aeng | ||
082 |
_a502.825 _bZ873a |
||
100 | _aZuo, Jian Min | ||
245 |
_aAdvanced transmission electron microscopy [Perpetual access] _bimaging and diffraction in nanoscience _cJian Min Zuo and John C.H. Spence |
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260 |
_bSpringer _c2017 _aNew York |
||
300 | _axxvi, 729p | ||
520 | _aThis volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns. | ||
650 | _aMaterials science | ||
650 | _aNanoscience | ||
650 | _aNanostructures | ||
700 | _aSpence, John C.H. | ||
856 | _uhttps://link.springer.com/book/10.1007%2F978-1-4939-6607-3 | ||
942 | _cEBK | ||
999 |
_c565139 _d565139 |