000			01981 a2200229 4500
003			OSt
020			_a9783319398778
040			_cIIT Kanpur
041			_aeng
082			_a502.825 _bEg26p2
100			_aR.F. Egerton
245			_aPhysical principles of electron microscopy [2nd ed.] [Perpetual access] _ban introduction to TEM, SEM, and AEM _cR.F. Egerton
250			_a2nd ed.
260			_bSpringer _c2016 _aSwitzerland
300			_axi,196p
520			_aThis popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
650			_aElectron microscopy
650			_aMicroscopy
650			_aNanotechnology
856			_uhttps://link.springer.com/book/10.1007%2F978-3-319-39877-8#about
942			_cEBK
999			_c565138 _d565138