000			01851 a2200229 4500
003			OSt
020			_a9783319266510
040			_cIIT Kanpur
041			_aeng
082			_a502.825 _bT687
245			_aTransmission electron microscopy [Perpetual access] _bdiffraction, imaging, and spectrometry _cedited by C. Barry Carter and David B. Williams
260			_bSpringer _c2016 _aSwitzerland
300			_axxxiii, 518p
520			_aThis text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science.
650			_aTransmission electron microscopy
650			_aSpectrum analysis
650			_aNanoscience
700			_aCarter, C. Barry [ed.]
700			_aWilliams, David B. [ed.]
856			_uhttps://link.springer.com/book/10.1007%2F978-3-319-26651-0#about
942			_cEBK
999			_c565136 _d565136