| 000 | 00771nam a22002177a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20210318170855.0 | ||
| 008 | 210318b xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 100 | _aNorris, L. Fredrick | ||
| 245 |
_aOverlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [NASA TN D-3658] _cL. Fredrick Norris, Walter S. Cremens and Jhon W. Weeton |
||
| 260 |
_aWashington, D.C. _bNational Aeronautics and Space Administration _c1966 |
||
| 300 | _a6p | ||
| 440 | _aNational Aeronautics and Space Administration (NASA) | ||
| 650 | _aOverlay copy technique | ||
| 700 | _aNorris, L. Fredrick | ||
| 700 | _aCremens, Walter S | ||
| 700 | _aWeeton, John W | ||
| 942 | _cREF | ||
| 999 |
_c564380 _d564380 |
||