000 00642nam a22002177a 4500
005 20210217152019.0
008 210217b xxu||||| |||| 00| 0 eng d
040 _cIIT Kanpur
041 _aeng
100 _aOkamoto, Shin
245 _aTest control in BRI pseudo dynamic test system
_cShin Okamoto, Takashi Kaminosono, Masayoshi Nakashima and Hiroto Kato
260 _bMinistry of Construction
_c1986
300 _a35p
440 _aB R I reaearch paper no/121
490 _aNo.121
650 _aPseudo dynamic test
700 _aKaminosono, Takashi
700 _aNakashima, Masayoshi
700 _aKato, Hiroto
942 _cREF
999 _c564114
_d564114