000 | 00642nam a22002177a 4500 | ||
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005 | 20210217152019.0 | ||
008 | 210217b xxu||||| |||| 00| 0 eng d | ||
040 | _cIIT Kanpur | ||
041 | _aeng | ||
100 | _aOkamoto, Shin | ||
245 |
_aTest control in BRI pseudo dynamic test system _cShin Okamoto, Takashi Kaminosono, Masayoshi Nakashima and Hiroto Kato |
||
260 |
_bMinistry of Construction _c1986 |
||
300 | _a35p | ||
440 | _aB R I reaearch paper no/121 | ||
490 | _aNo.121 | ||
650 | _aPseudo dynamic test | ||
700 | _aKaminosono, Takashi | ||
700 | _aNakashima, Masayoshi | ||
700 | _aKato, Hiroto | ||
942 | _cREF | ||
999 |
_c564114 _d564114 |