000			01469 a2200229 4500
003			OSt
005			20210706150256.0
008			210204b xxu||||| |||| 00| 0 eng d
020			_a9781461492818
040			_cIIT Kanpur
041			_aeng
082			_a620.11 _bSa72p
245			_aPractical materials characterization [Perpetual] _cedited by Mauro Sardela
260			_bSpringer _c2014 _aNew York
300			_avii, 242p
520			_aThis unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.
650			_aMaterials -- Analysis
650			_aMass spectrometry
700			_aSardela, Mauro [ed.]
856			_uhttps://link.springer.com/book/10.1007/978-1-4614-9281-8
942			_cEBK
999			_c563617 _d563617