000 04722nam a2200745 i 4500
001 6812676
003 IEEE
005 20200413152912.0
006 m eo d
007 cr cn |||m|||a
008 131221s2014 caua foab 000 0 eng d
020 _a9781627051903
_qebook
020 _z9781627051897
_qprint
024 7 _a10.2200/S00547ED1V01Y201311PEL006
_2doi
035 _a(CaBNVSL)swl00402969
035 _a(OCoLC)866564238
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871.85
_b.G237 2014
082 0 4 _a621.38152
_223
090 _a
_bMoCl
_e201311PEL006
100 1 _aGachovska, Tanya Kirilova.,
_eauthor.
245 1 0 _aTransient electro-thermal modeling of bipolar power semiconductor devices /
_cTanya Kirilova Gachovska, Bin Du, Jerry L. Hudgins, Enrico Santi.
264 1 _aSan Rafael, California (1537 Fourth Street, San Rafael, CA 94901 USA) :
_bMorgan & Claypool,
_c2014.
300 _a1 PDF (xvi, 68 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _aSynthesis lectures on power electronics,
_x1931-9533 ;
_v# 6
538 _aMode of access: World Wide Web.
538 _aSystem requirements: Adobe Acrobat Reader.
500 _aPart of: Synthesis digital library of engineering and computer science.
500 _aSeries from website.
504 _aIncludes bibliographical references (page 65).
505 0 _aNomenclature -- 1. Temperature dependencies of material and device parameters -- 1.1 Introduction -- 1.2 Temperature dependencies -- 1.2.1 Intrinsic carrier concentration -- 1.2.2 Ionized donor impurity concentration -- 1.2.3 Carrier mobility -- 1.2.4 Lifetime -- 1.2.5 Emitter recombination parameters -- 1.2.6 Threshold voltage and transconductance --
505 8 _a2. One-dimensional thermal model -- 2.1 Package design -- 2.2 Heat conduction problem in DBC structure -- 2.3 Equivalent RC network thermal model -- 2.4 One-dimensional Fourier series thermal model --
505 8 _a3. Realization of Power IGBT and diode thermal model -- 3.1 Introduction -- 3.2 Realization of equivalent RC network -- 3.3 Realization of one-dimensional Fourier-series thermal model -- 3.4 Temperature dependent parameters of diodes and their connection to an electrical model -- 3.5 Temperature-dependent parameters of NPT IGBT and their connection to the electrical model --
505 8 _aA. Appendix -- References -- Authors' biographies.
506 1 _aAbstract freely available; full-text restricted to subscribers or individual document purchasers.
510 0 _aCompendex
510 0 _aINSPEC
510 0 _aGoogle scholar
510 0 _aGoogle book search
520 3 _aThis book presents physics-based electro-thermal models of bipolar power semiconductor devices including their packages, and describes their implementation in MATLAB and Simulink. It is a continuation of our first book Modeling of Bipolar Power Semiconductor Devices. The device electrical models are developed by subdividing the devices into different regions and the operations in each region, along with the interactions at the interfaces, are analyzed using the basic semi-conductor physics equations that govern device behavior. The Fourier series solution is used to solve the ambipolar diffusion equation in the lightly doped drift region of the devices. In addition to the external electrical characteristics, internal physical and electrical information, such as junction voltages and carrier distribution in different regions of the device, can be obtained using the models.
530 _aAlso available in print.
588 _aTitle from PDF title page (viewed on December 21, 2013).
650 0 _aPower semiconductors
_xMathematical models.
650 0 _aInsulated gate bipolar transistors
_xMathematical models.
653 _apower semiconductor devices
653 _aphysics-based model
653 _aFourier series solution
653 _adrift region
653 _acarrier diffusion
653 _atransient switching behavior
653 _athermal model
653 _apackaging
653 _amodules
700 1 _aDu, Bin.,
_eauthor.
700 1 _aHudgins, Jerry L.,
_eauthor.
700 1 _aSanti, Enrico.,
_eauthor.
776 0 8 _iPrint version:
_z9781627051897
830 0 _aSynthesis digital library of engineering and computer science.
830 0 _aSynthesis lectures on power electronics ;
_v# 6.
_x1931-9533
856 4 2 _3Abstract with links to resource
_uhttp://ieeexplore.ieee.org/servlet/opac?bknumber=6812676
856 4 0 _3Abstract with links to full text
_uhttp://dx.doi.org/10.2200/S00547ED1V01Y201311PEL006
999 _c562042
_d562042