000 04551nam a2200661 i 4500
001 6813481
003 IEEE
005 20200413152909.0
006 m eo d
007 cr cn |||m|||a
008 130419s2013 caua foab 000 0 eng d
020 _a9781627051224 (electronic bk.)
020 _z9781627051217 (pbk.)
024 7 _a10.2200/S00483ED1V01Y201302PEL005
_2doi
035 _a(CaBNVSL)swl00402294
035 _a(OCoLC)837360310
040 _aCaBNVSL
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871.85
_b.M636 2013
082 0 4 _a621.38152
_223
090 _a
_bMoCl
_e201302PEL005
245 0 0 _aModeling bipolar power semiconductor devices
_h[electronic resource] /
_cTanya K. Gachovska ... [et al.].
260 _aSan Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) :
_bMorgan & Claypool,
_cc2013.
300 _a1 electronic text (xviii, 75 p.) :
_bill., digital file.
490 1 _aSynthesis lectures on power electronics,
_x1931-9533 ;
_v# 5
538 _aMode of access: World Wide Web.
538 _aSystem requirements: Adobe Acrobat Reader.
500 _aPart of: Synthesis digital library of engineering and computer science.
500 _aSeries from website.
504 _aIncludes bibliographical references (p. 71-72).
505 0 _a1. Introduction to power semiconductor device modeling --
505 8 _a2. Physics of power semiconductor devices -- 2.1 On-state operation of bipolar devices -- 2.1.1 Lightly doped drift region -- 2.1.2 Depletion region -- 2.1.3 Emitter regions -- 2.1.4 Base or gate regions -- 2.1.5 N buffer layer region -- 2.1.6 MOS gate -- 2.2 Off state --
505 8 _a3. Modeling of a power diode and IGBT -- 3.1 Modeling a power diode -- 3.1.1 P+ emitter region -- 3.1.2 N- drift region -- 3.1.3 N+ emitter region -- 3.1.4 Voltage drop -- 3.2 Modeling an NPT IGBT -- 3.2.1 P emitter region -- 3.2.2 N- drift region -- 3.2.3 MOS region -- 3.2.4 Voltage drop --
505 8 _a4. IGBT under an inductive load-switching condition in Simulink -- 4.1 Electrical circuit in Simulink -- 4.2 Diode subsystem -- 4.3 NPT IGBT subsystem --
505 8 _a5. Parameter extraction -- 5.1 Parameter estimation for power diodes -- 5.1.1 Area A -- 5.1.2 High-level injection lifetime HL -- 5.1.3 Drift region doping NN- -- 5.1.4 Drift region width WN- -- 5.1.5 Recombination parameters hn and hp -- 5.2 Parameter estimation for IGBTs -- 5.2.1 MOS parameters -- 5.2.2 IGBT geometry parameters -- 5.2.3 IGBT drift region parameters -- 5.2.4 IGBT lifetime parameters -- 5.2.5 IGBT recombination and buffer layer parameters -- 5.3 Initial circuit parameter estimation --
505 8 _aReferences -- Authors' biographies.
506 1 _aAbstract freely available; full-text restricted to subscribers or individual document purchasers.
510 0 _aCompendex
510 0 _aINSPEC
510 0 _aGoogle scholar
510 0 _aGoogle book search
520 3 _aThis book presents physics-based models of bipolar power semiconductor devices and their implementation in MATLAB and Simulink. The devices are subdivided into different regions, and the operation in each region, along with the interactions at the interfaces which are analyzed using basic semiconductor physics equations that govern their behavior. The Fourier series solution is used to solve the ambipolar diffusion equation in the lightly doped drift region of the devices. In addition to the external electrical characteristics, internal physical and electrical information, such as the junction voltages and the carrier distribution in different regions of the device, can be obtained using the models.
530 _aAlso available in print.
588 _aTitle from PDF t.p. (viewed on April 19, 2013).
650 0 _aPower semiconductors
_xMathematical models.
650 0 _aInsulated gate bipolar transistors
_xMathematical models.
653 _apower semiconductor devices
653 _aphysics-based model
653 _aFourier series solution
653 _adrift region
653 _acarrier diffusion
653 _atransient switching behavior
700 1 _aGachovska, Tanya K.
776 0 8 _iPrint version:
_z9781627051217
830 0 _aSynthesis digital library of engineering and computer science.
830 0 _aSynthesis lectures on power electronics ;
_v# 5.
_x1931-9533
856 4 2 _3Abstract with links to resource
_uhttp://ieeexplore.ieee.org/servlet/opac?bknumber=6813481
856 4 0 _3Abstract with links to full text
_uhttp://dx.doi.org/10.2200/S00483ED1V01Y201302PEL005
999 _c561981
_d561981