| 000 | 00532nam a22001817a 4500 | ||
|---|---|---|---|
| 005 | 20170831121533.0 | ||
| 008 | 170831b xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a621.395 _bC421u |
||
| 100 | _aCheng, Kwang-ting | ||
| 245 |
_aUnified methods for VLSI simulation and test generation _cKwang -Ting Cheng and Vishwani D. Agrawal |
||
| 260 |
_aDordrecht _bKluwer Academic Publishers _c1989 |
||
| 300 | _axii, 148p | ||
| 650 | _aVLSI -- Simulation | ||
| 650 | _aTest generation | ||
| 942 | _cBK | ||
| 999 |
_c557905 _d557905 |
||