000 00320nas a22000977a 4500
008 170117s9999 xx 000 0 und d
022 _a0026-2714
245 _aMicroelectronics Reliability
_h[e-journal]
260 _bElsevier
856 _uhttp://www.sciencedirect.com/science/journal/00262714
_yeSS consortium 1962 - Current
999 _c553632
_d553632