000 | 00320nas a22000977a 4500 | ||
---|---|---|---|
008 | 170117s9999 xx 000 0 und d | ||
022 | _a0026-2714 | ||
245 |
_aMicroelectronics Reliability _h[e-journal] |
||
260 | _bElsevier | ||
856 |
_uhttp://www.sciencedirect.com/science/journal/00262714 _yeSS consortium 1962 - Current |
||
999 |
_c553632 _d553632 |