000 00309nas a22000977a 4500
008 170117s9999 xx 000 0 und d
022 _a0921-5956
245 _aIndustrial Metrology
_h[e-journal]
260 _bElsevier
856 _uhttp://www.sciencedirect.com/science/journal/09215956
_yeSS consortium 1990 - 1992
999 _c551745
_d551745