000 00341nas a22000977a 4500
008 170117s9999 xx 000 0 und d
022 _a1530-4388
245 _aIEEE Transactions on Device and Materials Reliability
_h[e-journal]
260 _bIEEE
856 _uhttp://ieeexplore.ieee.org/servlet/opac?punumber=7298
_yeSS consortium 2001 - Current
999 _c551546
_d551546