000 00331nas a22000977a 4500
008 170117s9999 xx 000 0 und d
022 _a1094-6969
245 _aIEEE Instrumentation & Measurement Magazine
_h[e-journal]
260 _bIEEE
856 _uhttp://ieeexplore.ieee.org/servlet/opac?punumber=5289
_yeSS consortium 1998 - Current
999 _c551429
_d551429