000 00314nas a22000977a 4500
008 170117s9999 xx 000 0 und d
022 _a0740-7475
245 _aIEEE Design & Test of Computers
_h[e-journal]
260 _bIEEE
856 _uhttp://ieeexplore.ieee.org/servlet/opac?punumber=54
_yeSS consortium 1984 - 2012
999 _c551415
_d551415