000 00309nas a22000977a 4500
008 170117s9999 xx 000 0 und d
022 _a2168-2356
245 _aIEEE Design & Test
_h[e-journal]
260 _bIEEE
856 _uhttp://ieeexplore.ieee.org/servlet/opac?punumber=6221038
_yeSS consortium 2013 - Current
999 _c551414
_d551414