| 000 | 00559 a2200205 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230518113035.0 | ||
| 008 | 170125b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9783319398761 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a502.825 _bEg26p2 |
||
| 100 | _aEgerton, R. F. | ||
| 245 |
_aPhysical principles of electron microscopy _ban introduction to TEM, SEM, and AEM [2nd ed.] _cR. F. Egerton |
||
| 250 | _a2nd ed. | ||
| 260 |
_aSwitzerland _bSpringer _c2016 |
||
| 300 | _axi, 196p | ||
| 650 | _aElectron microscopy | ||
| 942 | _cBK | ||
| 999 |
_c543343 _d543343 |
||