000 04671nam a22005655i 4500
001 978-3-540-73886-2
003 DE-He213
005 20161121231145.0
007 cr nn 008mamaa
008 100301s2008 gw | s |||| 0|eng d
020 _a9783540738862
_9978-3-540-73886-2
024 7 _a10.1007/978-3-540-73886-2
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aFultz, Brent.
_eauthor.
245 1 0 _aTransmission Electron Microscopy and Diffractometry of Materials
_h[electronic resource] /
_cby Brent Fultz, James M. Howe.
250 _aThird Edition.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2008.
300 _aXX, 758 p. 440 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aDiffraction and the X-Ray Powder Diffractometer -- The TEM and its Optics -- Scattering -- Inelastic Electron Scattering and Spectroscopy -- Diffraction from Crystals -- Electron Diffraction and Crystallography -- Diffraction Contrast in TEM Images -- Diffraction Lineshapes -- Patterson Functions and Diffuse Scattering -- High-Resolution TEM Imaging -- High-Resolution STEM Imaging -- Dynamical Theory.
520 _aThis book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’ Ronald Gronsky, University of California, Berkeley.
650 0 _aMaterials science.
650 0 _aSolid state physics.
650 0 _aCrystallography.
650 0 _aSpectroscopy.
650 0 _aMicroscopy.
650 0 _aEngineering.
650 0 _aMaterials
_xSurfaces.
650 0 _aThin films.
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aCrystallography.
650 2 4 _aSolid State Physics.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aEngineering, general.
700 1 _aHowe, James M.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783540738855
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-540-73886-2
912 _aZDB-2-CMS
950 _aChemistry and Materials Science (Springer-11644)
999 _c509410
_d509410