000 | 04113nam a22005655i 4500 | ||
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001 | 978-3-540-37321-6 | ||
003 | DE-He213 | ||
005 | 20161121231141.0 | ||
007 | cr nn 008mamaa | ||
008 | 100301s2007 gw | s |||| 0|eng d | ||
020 |
_a9783540373216 _9978-3-540-37321-6 |
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024 | 7 |
_a10.1007/11785705 _2doi |
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050 | 4 | _aT174.7 | |
072 | 7 |
_aTDPB _2bicssc |
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072 | 7 |
_aTEC027000 _2bisacsh |
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082 | 0 | 4 |
_a620.5 _223 |
245 | 1 | 0 |
_aApplied Scanning Probe Methods VII _h[electronic resource] : _bBiomimetics and Industrial Applications / _cedited by Bharat Bhushan, Harald Fuchs. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2007. |
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300 |
_aXLV, 380 p. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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490 | 1 |
_aNanoScience and Technology, _x1434-4904 |
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505 | 0 | _aLotus Effect: Roughness-Induced Superhydrophobicity -- Gecko Feet: Natural Attachment Systems for Smart Adhesion -- Novel AFM Nanoprobes -- Nanoelectromechanical Systems — Experiments and Modeling -- Application of Atom-resolved Scanning Tunneling Microscopy in Catalysis Research -- Nanostructuration and Nanoimaging of Biomolecules for Biosensors -- Applications of Scanning Electrochemical Microscopy (SECM) -- Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives -- Development of MOEMS Devices and Their Reliability Issues. | |
520 | _aThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging. | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aPhysical chemistry. | |
650 | 0 | _aPolymers. | |
650 | 0 | _aSolid state physics. | |
650 | 0 | _aNanotechnology. | |
650 | 0 |
_aMaterials _xSurfaces. |
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650 | 0 | _aThin films. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aNanotechnology and Microengineering. |
650 | 2 | 4 | _aNanotechnology. |
650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
650 | 2 | 4 | _aPolymer Sciences. |
650 | 2 | 4 | _aPhysical Chemistry. |
650 | 2 | 4 | _aSolid State Physics. |
700 | 1 |
_aBhushan, Bharat. _eeditor. |
|
700 | 1 |
_aFuchs, Harald. _eeditor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783540373209 |
830 | 0 |
_aNanoScience and Technology, _x1434-4904 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/11785705 |
912 | _aZDB-2-CMS | ||
950 | _aChemistry and Materials Science (Springer-11644) | ||
999 |
_c509321 _d509321 |