000			03314nam a22005655i 4500
001			978-1-4020-8615-1
003			DE-He213
005			20161121231139.0
007			cr nn 008mamaa
008			100301s2008 ne | s |||| 0|eng d
020			_a9781402086151 _9978-1-4020-8615-1
024	7		_a10.1007/978-1-4020-8615-1 _2doi
050		4	_aTA401-492
072		7	_aTGM _2bicssc
072		7	_aTEC021000 _2bisacsh
082	0	4	_a620.11 _223
245	1	0	_aMicroscopy of Semiconducting Materials 2007 _h[electronic resource] / _cedited by A. G. Cullis, P. A. Midgley.
264		1	_aDordrecht : _bSpringer Netherlands, _c2008.
300			_aXIV, 498 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aSpringer Proceedings in Physics, _x0930-8989 ; _v120
505	0		_aWide Band-Gap Nitrides -- General Heteroepitaxial Layers -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device and Doping Studies -- FIB, SEM and SPM Advances.
520			_aThe fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focused upon the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy, scanning probe microscopy and X-ray-based methods. Conference sessions concentrated on key topics including state-of-the-art studies in high resolution imaging and analytical electron microscopy, advanced scanning probe microscopy, scanning electron microscopy and focused ion beam applications, novel epitaxial layer phenomena, the properties of quantum nanostructures, III-nitride developments, GeSi/Si for advanced devices, metal-semiconductor contacts and silicides and the important effects of critical device processing treatments. Accordingly, this volume should be of direct interest to researchers in areas ranging from fundamental studies to electronic device assessment.
650		0	_aMaterials science.
650		0	_aSolid state physics.
650		0	_aPhysical measurements.
650		0	_aMeasurement.
650		0	_aSpectroscopy.
650		0	_aMicroscopy.
650		0	_aElectronics.
650		0	_aMicroelectronics.
650	1	4	_aMaterials Science.
650	2	4	_aMaterials Science, general.
650	2	4	_aSolid State Physics.
650	2	4	_aSpectroscopy and Microscopy.
650	2	4	_aMeasurement Science and Instrumentation.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
700	1		_aCullis, A. G. _eeditor.
700	1		_aMidgley, P. A. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781402086144
830		0	_aSpringer Proceedings in Physics, _x0930-8989 ; _v120
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4020-8615-1
912			_aZDB-2-CMS
950			_aChemistry and Materials Science (Springer-11644)
999			_c509275 _d509275