000			03653nam a22005295i 4500
001			978-0-387-39620-0
003			DE-He213
005			20161121231134.0
007			cr nn 008mamaa
008			100301s2007 xxu| s |||| 0|eng d
020			_a9780387396200 _9978-0-387-39620-0
024	7		_a10.1007/978-0-387-39620-0 _2doi
050		4	_aT174.7
050		4	_aTA418.9.N35
072		7	_aTBN _2bicssc
072		7	_aTEC027000 _2bisacsh
072		7	_aSCI050000 _2bisacsh
082	0	4	_a620.115 _223
245	1	0	_aScanning Microscopy for Nanotechnology _h[electronic resource] : _bTechniques and Applications / _cedited by Weilie Zhou, Zhong Lin Wang.
264		1	_aNew York, NY : _bSpringer New York, _c2007.
300			_aXIV, 522 p. 399 illus. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aFundamentals of Scanning Electron Microscopy (SEM) -- Backscattering Detector and EBSD in Nanomaterials Characterization -- X-ray Microanalysis in Nanomaterials -- Low kV Scanning Electron Microscopy -- E-beam Nanolithography Integrated with Scanning Electron Microscope -- Scanning Transmission Electron Microscopy for Nanostructure Characterization -- to In-Situ Nanomanipulation for Nanomaterials Engineering -- Applications of FIB and DualBeam for Nanofabrication -- Nanowires and Carbon Nanotubes -- Photonic Crystals and Devices -- Nanoparticles and Colloidal Self-assembly -- Nano-building Blocks Fabricated through Templates -- One-dimensional Wurtzite Semiconducting Nanostructures -- Bio-inspired Nanomaterials -- Cryo-Temperature Stages in Nanostructural Research.
520			_aScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
650		0	_aMaterials science.
650		0	_aPhysical measurements.
650		0	_aMeasurement.
650		0	_aOptical materials.
650		0	_aElectronic materials.
650		0	_aNanotechnology.
650	1	4	_aMaterials Science.
650	2	4	_aNanotechnology.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aMeasurement Science and Instrumentation.
700	1		_aZhou, Weilie. _eeditor.
700	1		_aWang, Zhong Lin. _eeditor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387333250
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-39620-0
912			_aZDB-2-CMS
950			_aChemistry and Materials Science (Springer-11644)
999			_c509158 _d509158