000 04455nam a22005535i 4500
001 978-1-84628-173-0
003 DE-He213
005 20161121231113.0
007 cr nn 008mamaa
008 100301s2006 xxk| s |||| 0|eng d
020 _a9781846281730
_9978-1-84628-173-0
024 7 _a10.1007/1-84628-173-3
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aGrout, Ian A.
_eauthor.
245 1 0 _aIntegrated Circuit Test Engineering
_h[electronic resource] :
_bModern Techniques /
_cby Ian A. Grout.
264 1 _aLondon :
_bSpringer London,
_c2006.
300 _aXXX, 362 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _ato Integrated Circuit Test Engineering -- Fabrication Processes for Integrated Circuits -- Digital Logic Test -- Memory Test -- Analogue Test -- Mixed-Signal Test -- Input-Output Test -- Design for Testability — Structured Test Approaches -- System on a Chip (SoC) Test -- Test Pattern Generation and Fault Simulation -- Automatic Test Equipment (ATE) and Production Test -- Test Economics.
520 _aNearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits. Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about: • fabrication processes; • a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use; • how to design for testability; • fault simulation; • automatic test equipment and • the economics of testing. From a practical perspective, the text includes: • A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry. • An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL. • A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic and printed-circuit-board layout)with Visual Basic programs to drive the experiments. Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer.
650 0 _aEngineering.
650 0 _aComputer hardware.
650 0 _aComputer system failures.
650 0 _aIndustrial engineering.
650 0 _aProduction engineering.
650 0 _aElectrical engineering.
650 0 _aElectronics.
650 0 _aMicroelectronics.
650 0 _aElectronic circuits.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectrical Engineering.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aComputer Hardware.
650 2 4 _aSystem Performance and Evaluation.
650 2 4 _aIndustrial and Production Engineering.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781846280238
856 4 0 _uhttp://dx.doi.org/10.1007/1-84628-173-3
912 _aZDB-2-ENG
950 _aEngineering (Springer-11647)
999 _c508632
_d508632