000			03236nam a22005415i 4500
001			978-0-387-31419-8
003			DE-He213
005			20161121231108.0
007			cr nn 008mamaa
008			100301s2006 xxu| s |||| 0|eng d
020			_a9780387314198 _9978-0-387-31419-8
024	7		_a10.1007/978-0-387-31419-8 _2doi
050		4	_aTK1-9971
072		7	_aTJK _2bicssc
072		7	_aTEC041000 _2bisacsh
082	0	4	_a621.382 _223
100	1		_aMaichen, Wolfgang. _eauthor.
245	1	0	_aDigital Timing Measurements _h[electronic resource] : _bFrom Scopes and Probes to Timing and Jitter / _cby Wolfgang Maichen.
264		1	_aBoston, MA : _bSpringer US, _c2006.
300			_aXIV, 240 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aFrontiers in Electronic Testing, _x0929-1296 ; _v33
505	0		_aChapter I: Electrical Basics. 1. Time domain and frequency domain. 2. Transmission line theory -- Chapter II: Measurement Hardware. 1. Oscilloscopes and CO. 2. Key instrument parameters. 3. Probes. 4. Accessories -- Chapter III: Timing and Jitter. 1. Statistical basics. 2. Rise time measurements. 3. Understanding jitter. 4. Jitter Analysis -- Chapter IV: Measurement Accuracy. 1. Specialized Measurement Techniques. 2. Digital Signal Processing -- References -- Index.
520			_aAs many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour, an engineer needs a knowledge base covering instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. Very often even the most experienced digital test engineers, while mastering some of those subjects, lack systematic knowledge or experience in the high speed signal area. Digital Timing Measurements gives a compact, practice-oriented overview on all those subjects. The emphasis is on useable concepts and real-life guidelines that can be readily put into practice, with references to the underlying mathematical theory. It unites in one place a variety of information relevant to high speed testing, measurement, signal fidelity, and instrumentation.
650		0	_aEngineering.
650		0	_aEngineering design.
650		0	_aElectrical engineering.
650		0	_aElectronics.
650		0	_aMicroelectronics.
650		0	_aElectronic circuits.
650	1	4	_aEngineering.
650	2	4	_aCommunications Engineering, Networks.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectrical Engineering.
650	2	4	_aEngineering Design.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aSignal, Image and Speech Processing.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387314181
830		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v33
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-31419-8
912			_aZDB-2-ENG
950			_aEngineering (Springer-11647)
999			_c508508 _d508508