000 04179nam a22005895i 4500
001 978-3-540-27453-7
003 DE-He213
005 20161121231101.0
007 cr nn 008mamaa
008 100301s2006 gw | s |||| 0|eng d
020 _a9783540274537
_9978-3-540-27453-7
024 7 _a10.1007/b139097
_2doi
050 4 _aT174.7
072 7 _aTDPB
_2bicssc
072 7 _aTEC027000
_2bisacsh
082 0 4 _a620.5
_223
245 1 0 _aApplied Scanning Probe Methods II
_h[electronic resource] :
_bScanning Probe Microscopy Techniques /
_cedited by Bharat Bhushan, Harald Fuchs.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2006.
300 _aXLIII, 420 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aNanoScience and Technology,
_x1434-4904
505 0 _aHigher Harmonics in Dynamic Atomic Force Microscopy -- Atomic Force Acoustic Microscopy -- Scanning Ion Conductance Microscopy -- Spin-Polarized Scanning Tunneling Microscopy -- Dynamic Force Microscopy and Spectroscopy -- Sensor Technology for Scanning Probe Microscopy and New Applications -- Quantitative Nanomechanical Measurements in Biology -- Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale -- Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices -- Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures -- Focused Ion Beam as a Scanning Probe: Methods and Applications.
520 _aThe Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
650 0 _aEngineering.
650 0 _aPolymers.
650 0 _aSurfaces (Physics).
650 0 _aInterfaces (Physical sciences).
650 0 _aThin films.
650 0 _aSpectroscopy.
650 0 _aMicroscopy.
650 0 _aNanotechnology.
650 0 _aMaterials
_xSurfaces.
650 1 4 _aEngineering.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aSurface and Interface Science, Thin Films.
650 2 4 _aNanotechnology.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aPolymer Sciences.
700 1 _aBhushan, Bharat.
_eeditor.
700 1 _aFuchs, Harald.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783540262428
830 0 _aNanoScience and Technology,
_x1434-4904
856 4 0 _uhttp://dx.doi.org/10.1007/b139097
912 _aZDB-2-CMS
950 _aChemistry and Materials Science (Springer-11644)
999 _c508324
_d508324