000 04202nam a22004815i 4500
001 978-1-4020-8006-7
003 DE-He213
005 20161121231100.0
007 cr nn 008mamaa
008 100301s2005 xxu| s |||| 0|eng d
020 _a9781402080067
_9978-1-4020-8006-7
024 7 _a10.1007/1-4020-8006-9
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
245 1 0 _aHandbook of Microscopy for Nanotechnology
_h[electronic resource] /
_cedited by Nan Yao, Zhong Lin Wang.
264 1 _aBoston, MA :
_bSpringer US,
_c2005.
300 _aXX, 731 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aOptical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication -- Confocal Scanning Optical Microscopy and Nanotechnology -- Scanning Near-Field Optical Microscopy in Nanosciences -- Scanning Tunneling Microscopy -- Visualization of Nanostructures with Atomic Force Microscopy -- Scanning Probe Microscopy for Nanoscale Manipulation and Patterning -- Scanning Thermal and Thermoelectric Microscopy -- Imaging Secondary Ion Mass Spectrometry -- Atom Probe Tomography -- Focused Ion Beam System—a Multifunctional Tool for Nanotechnology -- Electron Beam Lithography -- Electron Microscopy -- High-Resolution Scanning Electron Microscopy -- High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials -- Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope -- High Resolution Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy -- In-Situ Electron Microscopy for Nanomeasurements -- Environmental Transmission Electron Microscopy in Nanotechnology -- Electron Nanocrystallography -- Tomography Using the Transmission Electron Microscope -- Off-Axis Electron Holography -- SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy -- Imaging Magnetic Structures Using TEM.
520 _aNanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
650 0 _aMaterials science.
650 0 _aAnalytical chemistry.
650 0 _aCondensed matter.
650 0 _aNanotechnology.
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aNanotechnology.
650 2 4 _aCondensed Matter Physics.
650 2 4 _aAnalytical Chemistry.
700 1 _aYao, Nan.
_eeditor.
700 1 _aWang, Zhong Lin.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781402080036
856 4 0 _uhttp://dx.doi.org/10.1007/1-4020-8006-9
912 _aZDB-2-CMS
950 _aChemistry and Materials Science (Springer-11644)
999 _c508289
_d508289