000			03122nam a22006015i 4500
001			978-0-387-37231-0
003			DE-He213
005			20161121231057.0
007			cr nn 008mamaa
008			100301s2006 xxu| s |||| 0|eng d
020			_a9780387372310 _9978-0-387-37231-0
024	7		_a10.1007/0-387-37231-8 _2doi
050		4	_aTA404.6
072		7	_aTGMT _2bicssc
072		7	_aTEC021000 _2bisacsh
082	0	4	_a620.11 _223
100	1		_aFoster, Adam. _eauthor.
245	1	0	_aScanning Probe Microscopy _h[electronic resource] : _bAtomic Scale Engineering by Forces and Currents / _cby Adam Foster, Werner Hofer.
264		1	_aNew York, NY : _bSpringer New York, _c2006.
300			_aXIV, 282 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aNanoScience and Technology, _x1434-4904
505	0		_aThe Physics of Scanning Probe Microscopes -- SPM: The Instrument -- Theory of Forces -- Electron Transport Theory -- Transport in the Low Conductance Regime -- Bringing Theory to Experiment in SFM -- Topographic images -- Single-Molecule Chemistry -- Current and Force Spectroscopy -- Outlook.
520			_aScanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
650		0	_aMaterials science.
650		0	_aAtomic structure.
650		0	_aMolecular structure.
650		0	_aSpectra.
650		0	_aSolid state physics.
650		0	_aSpectroscopy.
650		0	_aMicroscopy.
650		0	_aNanotechnology.
650		0	_aMaterials _xSurfaces.
650		0	_aThin films.
650	1	4	_aMaterials Science.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aNanotechnology.
650	2	4	_aSurfaces and Interfaces, Thin Films.
650	2	4	_aAtomic/Molecular Structure and Spectra.
650	2	4	_aSolid State Physics.
650	2	4	_aSpectroscopy and Microscopy.
700	1		_aHofer, Werner. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387400907
830		0	_aNanoScience and Technology, _x1434-4904
856	4	0	_uhttp://dx.doi.org/10.1007/0-387-37231-8
912			_aZDB-2-CMS
950			_aChemistry and Materials Science (Springer-11644)
999			_c508213 _d508213