000			02276nam a22005055i 4500
001			978-3-540-71925-0
003			DE-He213
005			20161121231050.0
007			cr nn 008mamaa
008			100301s2008 gw | s |||| 0|eng d
020			_a9783540719250 _9978-3-540-71925-0
024	7		_a10.1007/978-3-540-71925-0 _2doi
050		4	_aQC350-467
050		4	_aTA1501-1820
050		4	_aQC392-449.5
050		4	_aTA1750-1750.22
072		7	_aTTB _2bicssc
072		7	_aPHJ _2bicssc
072		7	_aTEC030000 _2bisacsh
082	0	4	_a621.36 _223
100	1		_aLiebl, Helmut. _eauthor.
245	1	0	_aApplied Charged Particle Optics _h[electronic resource] / _cby Helmut Liebl.
264		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2008.
300			_aX, 131 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aLenses: Basic Optics -- Electrostatic Deflection -- Magnetic Deflection -- Image Aberrations -- Fringe Field Confinement.
520			_aAuthored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
650		0	_aPhysics.
650		0	_aOptics.
650		0	_aOptoelectronics.
650		0	_aPlasmons (Physics).
650		0	_aEngineering.
650	1	4	_aPhysics.
650	2	4	_aOptics, Optoelectronics, Plasmonics and Optical Devices.
650	2	4	_aEngineering, general.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783540719243
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-540-71925-0
912			_aZDB-2-PHA
950			_aPhysics and Astronomy (Springer-11651)
999			_c508028 _d508028