000			03576nam a22005175i 4500
001			978-0-387-69011-7
003			DE-He213
005			20161121230532.0
007			cr nn 008mamaa
008			100301s2008 xxu| s |||| 0|eng d
020			_a9780387690117 _9978-0-387-69011-7
024	7		_a10.1007/978-0-387-69011-7 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aOrshansky, Michael. _eauthor.
245	1	0	_aDesign for Manufacturability and Statistical Design _h[electronic resource] : _bA Constructive Approach / _cby Michael Orshansky, Sani R. Nassif, Duane Boning.
264		1	_aBoston, MA : _bSpringer US, _c2008.
300			_aXIV, 316 p. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aSources of Variability -- Front End Variability -- Back End Variability -- Environmental Variability -- Variability Characterization and Analysis -- Test Structures For Variability -- Statistical Foundations Of Data Analysis And Modeling -- Design Techniques for Systematic Manufacturability Problems -- Lithography Enhancement Techniques -- Ensuring Interconnect Planarity -- Statistical Circuit Design -- Statistical Circuit Analysis -- Statistical Static Timing Analysis -- Leakage Variability And Joint Parametric Yield -- Parametric Yield Optimization -- Conclusions.
520			_aDesign for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis; techniques of design for manufacturability in lithography and in chemical mechanical polishing; statistical simulation, analysis, and optimization techniques for improving parametric yield. Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
650		0	_aEngineering.
650		0	_aComputer-aided engineering.
650		0	_aIndustrial engineering.
650		0	_aProduction engineering.
650		0	_aElectrical engineering.
650		0	_aElectronic circuits.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aComputer-Aided Engineering (CAD, CAE) and Design.
650	2	4	_aIndustrial and Production Engineering.
650	2	4	_aElectrical Engineering.
700	1		_aNassif, Sani R. _eauthor.
700	1		_aBoning, Duane. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387309286
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-69011-7
912			_aZDB-2-ENG
950			_aEngineering (Springer-11647)
999			_c500210 _d500210