| 000 | 00434pam a2200145a 44500 | ||
|---|---|---|---|
| 008 | 160510b xxu||||| |||| 00| 0 eng d | ||
| 082 | _aNASA CR-721 | ||
| 100 | _aLOMBARDI,J,MCDONOUGH,L | ||
| 245 |
_aHIGH RELIABILITY SCREENING OF SEMICONDUCTOR AND INTEGRATED CIRCUIT DEVICES _b |
||
| 260 |
_a _bNASA, WASHINGTON, D.C. _c1967 |
||
| 300 | _a,150,,,,,, | ||
| 500 | _aBound with NASA CR-722-725 | ||
| 650 | _aGeological | ||
| 700 | _aPADDEN,H | ||
| 999 |
_c479673 _d479673 |
||