| 000 | 00777 a2200217 4500 | ||
|---|---|---|---|
| 020 | _a3908450640 | ||
| 082 |
_a621.38152 _bIN8G |
||
| 100 | _aV. Raineri,No | ||
| 245 | 1 |
_aGETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY _bGADEST 2001 _cINTERNATIONAL AUTUMN MEETING "GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY" (9TH : 2001 : S. TECLA, ITALY) |
|
| 260 |
_a _bScitec Publications, Zuerich _cc2002 |
||
| 300 | _axviii,823 | ||
| 440 |
_aDiffusion And Defect Data _vPt.B -- Solid State Phenomena |
||
| 650 | _aSemiconductors -- Defects -- Congresses | ||
| 650 | _aGetters -- Congresses | ||
| 650 | _aSilicon Crystals -- Defects -- Congresses | ||
| 700 | _aRaineri,V. | ||
| 700 | _a | ||
| 906 | _h0 | ||
| 964 | _gCIRC | ||
| 997 | _aA143109 s C | ||
| 999 |
_c467995 _d467995 |
||