| 000 | 00578 a2200193 4500 | ||
|---|---|---|---|
| 020 | _a8120411269 | ||
| 082 |
_a621.1127 _bT687N |
||
| 100 | _aC.G. Krishnands Nair | ||
| 245 | 1 |
_aTRENDS IN NDE SCIENCE AND TECHNOLOGY _cCONFERENCE ON NON DESTRUCTIVE TESTING(14TH: 1996: NEW DELHI) |
|
| 260 |
_a _bOxford & Ibh Publishing Co., New Delhi _cc1996 |
||
| 300 | _axxxiii | ||
| 500 | _aIncludes Bibliographical References And Index | ||
| 650 | _aNon Destructed Testing | ||
| 700 | _aNair,C.G. Krishnands | ||
| 700 | _a | ||
| 906 | _h0 | ||
| 964 | _gCIRC | ||
| 997 | _aA125765 s C | ||
| 999 |
_c467211 _d467211 |
||