000 | 00548 a2200193 4500 | ||
---|---|---|---|
020 | _a8120411250 | ||
082 |
_a621.1127 _bT687N |
||
100 | _aC.G. Krishnadas Nair | ||
245 | 1 |
_aTRENDS IN NDE SCIENCE AND TECHNOLOGY _cCONFERENCE ON NON DESTRUCTIVE TESTING(14TH: 1996: NEW DELHI) |
|
260 |
_a _bOxford & Ibh Publishing Co., New Delhi _cc1996 |
||
300 | _axxxiii | ||
500 | _aIncludes Index | ||
650 | _aNon Destructive Testing | ||
700 | _aNair,C.G. Krishnadas | ||
700 | _a | ||
906 | _h0 | ||
964 | _gCIRC | ||
997 | _aA125764 s C | ||
999 |
_c467210 _d467210 |