000 00582 a2200193 4500
020 _a8120411242
082 _a621.1127
_bT687N
100 _aC.G. Krishnadas Nair
245 1 _aTRENDS IN NDE SCIENCE AND TECHNOLOGY
_cCONFERENCE ON NON DESTRUCTIVE TESTING(14TH: 1996: NEW DELHI)
260 _a
_bOxford & Ibh Publishing Co.,New Delhi
_cc1996
300 _a
500 _aIncludes Bibliographical References And Indexes
650 _aNon Destructive Testing -- Cong
700 _aNair,C.G. Krishnadas
700 _a
906 _h0
964 _gCIRC
997 _aA125763 s C
999 _c467209
_d467209