| 000 | 00552 a2200193 4500 | ||
|---|---|---|---|
| 020 | _a8120411234 | ||
| 082 |
_a621.1127 _bT687N |
||
| 100 | _aC.G. Krishnadas Nair | ||
| 245 | 1 |
_aTRENDS IN NDE SCIENCE AND TECHNOLOGY _cCONFERENCE ON NON DESTRUCTIVE TESTING(14TH: 1996: NEW DELHI) |
|
| 260 |
_a _bOxford & Ibh Publishing Co.,New Delhi _cc1996 |
||
| 300 | _a314 | ||
| 500 | _aIncludes Index | ||
| 650 | _aNon-Destructive Testing -- Cong | ||
| 700 | _aNair,C.G. Krishnadas | ||
| 700 | _a | ||
| 906 | _h0 | ||
| 964 | _gCIRC | ||
| 997 | _aA125762 s C | ||
| 999 |
_c467198 _d467198 |
||